Email:fchxu@xmu.edu.cn
Phone:0592-2184829(O),2183059(H)
MT:13860121822
个人简历：
1986年7月beat365正版唯一官网物理系毕业，理学学士学位，2009年6月获beat365正版唯一官网理学博士学位。
研究兴趣：
主要从事Ⅲ-Ⅴ族宽禁带半导体材料的制备与表征工作，特别是对AES,UPS,XPS等表征方法有着丰富的经验。
近期主要代表论著：
[1] Fuchun Xu, Duanjun Cai and Junyong Kang. Phase identification from electronic structures by Auger electron spectroscopy. J. Mater. Res., 2008, 23: 83-86.
[2] Fuchun Xu, Qihe Zhang, Danxia Cen. In heating and thermal effects in Auger electron spectroscopy for GaN. Chinese Journal of Chemical Physics, 2006, 19(3): 200-202.
[3] Duanjun Cai, Fuchun Xu, Junyong Kang, P Gibart, and B Beaumont. High-spatial-resolution strain measurements by Auger electron spectroscopy in epitaxial-lateral-overgrowth GaN. Applied Physics Letter, 2005, 86 (21): 1917-1919
